May 8, 2023
3D µ standards for optical microscopes
3D µ standards for optical microscopes. Results of the joint project between PTB and point electronic will be presented for the first time at the Control Fair 2023 (PTB stand, 9104).
m2c microscopy measurement & calibration
News
February 27, 2023
New publication
Poster presentation at Microscopy Conference 2023 on "Using Machine Learning and Topographic SEM Imaging for Software Assisted Fractography"
December 7, 2020
New publication
M&A publication on "Geometrical Analysis in SEM". See full paper here: Geometrical Analysis in SEM
October 15, 2019
New publication
Poster contribution at Nanoscale 2019 with title: "Calibration of 3D reference standards using metrological large range AFM and calibrated confocal microscopy"
September 18, 2019
New publication
New publication at the 52nd Metallography Conference 2019 in Dresden with title In-situ Messung der 3D-Topografie von Bruchflächen im REM (in German). Data were recorded with DISS BSE-Topography system from point electronic GmbH.
October 23, 2018
3D calibration now integrated in DISS SEM control
M2C calibration technology is now integrated in Live-3D topography modul of DISS SEM control. The application of 3D calibration technology enables quantitative topography measurements with your SEM. All you need is DISS 3D topography extension for your SEM and an M2C calibration standard. Find further information on DISS 3D topography here.